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Fişne, A., Kalay, A., & Eken, S., (2024). Fast and efficient computing for deep learning-based defect detection models in lightweight devices. JOURNAL OF INTELLIGENT MANUFACTURING .

Fişne, Alparslan, Alperen Kalay, And SÜLEYMAN EKEN. "Fast and efficient computing for deep learning-based defect detection models in lightweight devices," JOURNAL OF INTELLIGENT MANUFACTURING , 2024

Fişne, Alparslan Et Al. "Fast and efficient computing for deep learning-based defect detection models in lightweight devices." JOURNAL OF INTELLIGENT MANUFACTURING , 2024

Fişne, A. Kalay, A. And Eken, S. (2024) . "Fast and efficient computing for deep learning-based defect detection models in lightweight devices." JOURNAL OF INTELLIGENT MANUFACTURING .

@article{article, author={Alparslan Fişne Et Al. }, title={Fast and efficient computing for deep learning-based defect detection models in lightweight devices}, journal={JOURNAL OF INTELLIGENT MANUFACTURING}, year=2024}