E. AFACAN Et Al. , "Semi empirical aging model development via accelerated aging test," Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2016 13th International Conference on , 2016
AFACAN, E. Et Al. 2016. Semi empirical aging model development via accelerated aging test. Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2016 13th International Conference on .
AFACAN, E., DÜNDAR, G., PUSANE, A. E., & BAŞKAYA, İ. F., (2016). Semi empirical aging model development via accelerated aging test . Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2016 13th International Conference on
AFACAN, ENGİN Et Al. "Semi empirical aging model development via accelerated aging test," Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2016 13th International Conference on, 2016
AFACAN, ENGİN Et Al. "Semi empirical aging model development via accelerated aging test." Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2016 13th International Conference on , 2016
AFACAN, E. Et Al. (2016) . "Semi empirical aging model development via accelerated aging test." Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2016 13th International Conference on .
@conferencepaper{conferencepaper, author={ENGİN AFACAN Et Al. }, title={Semi empirical aging model development via accelerated aging test}, congress name={Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2016 13th International Conference on}, city={}, country={}, year={2016}}