Zobiri, O. Et Al. 2021. A critical evaluation based on Lattice Boltzmann method of nanoscale thermal behavior inside MOSFET and SOI-MOSFET. Microelectronics Journal , vol.115 .

Zobiri, O., Atia, A., & ARICI, M., (2021). A critical evaluation based on Lattice Boltzmann method of nanoscale thermal behavior inside MOSFET and SOI-MOSFET. Microelectronics Journal , vol.115.

Zobiri, Oussama, Abdelmalek Atia, And MÜSLÜM ARICI. "A critical evaluation based on Lattice Boltzmann method of nanoscale thermal behavior inside MOSFET and SOI-MOSFET," Microelectronics Journal , vol.115, 2021

Zobiri, Oussama Et Al. "A critical evaluation based on Lattice Boltzmann method of nanoscale thermal behavior inside MOSFET and SOI-MOSFET." Microelectronics Journal , vol.115, 2021

Zobiri, O. Atia, A. And ARICI, M. (2021) . "A critical evaluation based on Lattice Boltzmann method of nanoscale thermal behavior inside MOSFET and SOI-MOSFET." Microelectronics Journal , vol.115.

@article{article, author={Oussama Zobiri Et Al. }, title={A critical evaluation based on Lattice Boltzmann method of nanoscale thermal behavior inside MOSFET and SOI-MOSFET}, journal={Microelectronics Journal}, year=2021}