E. Afacan Et Al. , "Reliability assessment of CMOS differential cross-coupled LC oscillators and a novel on chip self-healing approach against aging phenomena," Microelectronics Reliability , vol.54, no.2, pp.397-403, 2014
Afacan, E. Et Al. 2014. Reliability assessment of CMOS differential cross-coupled LC oscillators and a novel on chip self-healing approach against aging phenomena. Microelectronics Reliability , vol.54, no.2 , 397-403.
Afacan, E., Dundar, G., & Baskaya, F., (2014). Reliability assessment of CMOS differential cross-coupled LC oscillators and a novel on chip self-healing approach against aging phenomena. Microelectronics Reliability , vol.54, no.2, 397-403.
Afacan, ENGİN, Gunhan Dundar, And Faik Baskaya. "Reliability assessment of CMOS differential cross-coupled LC oscillators and a novel on chip self-healing approach against aging phenomena," Microelectronics Reliability , vol.54, no.2, 397-403, 2014
Afacan, ENGİN Et Al. "Reliability assessment of CMOS differential cross-coupled LC oscillators and a novel on chip self-healing approach against aging phenomena." Microelectronics Reliability , vol.54, no.2, pp.397-403, 2014
Afacan, E. Dundar, G. And Baskaya, F. (2014) . "Reliability assessment of CMOS differential cross-coupled LC oscillators and a novel on chip self-healing approach against aging phenomena." Microelectronics Reliability , vol.54, no.2, pp.397-403.
@article{article, author={ENGİN AFACAN Et Al. }, title={Reliability assessment of CMOS differential cross-coupled LC oscillators and a novel on chip self-healing approach against aging phenomena}, journal={Microelectronics Reliability}, year=2014, pages={397-403} }