İ. Ç. Odabaşı Et Al. , "A Rare Event Based Yield Estimation Methodology for Analog Circuits," 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits Systems (DDECS) , Budapest, Hungary, 2018
Odabaşı, İ. Ç. Et Al. 2018. A Rare Event Based Yield Estimation Methodology for Analog Circuits. 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits Systems (DDECS) , (Budapest, Hungary).
Odabaşı, İ. Ç., YELTEN, M. B., AFACAN, E., BAŞKAYA, İ. F., PUSANE, A. E., & DÜNDAR, G., (2018). A Rare Event Based Yield Estimation Methodology for Analog Circuits . 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits Systems (DDECS), Budapest, Hungary
Odabaşı, İzel Et Al. "A Rare Event Based Yield Estimation Methodology for Analog Circuits," 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits Systems (DDECS), Budapest, Hungary, 2018
Odabaşı, İzel Ç. Et Al. "A Rare Event Based Yield Estimation Methodology for Analog Circuits." 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits Systems (DDECS) , Budapest, Hungary, 2018
Odabaşı, İ. Ç. Et Al. (2018) . "A Rare Event Based Yield Estimation Methodology for Analog Circuits." 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits Systems (DDECS) , Budapest, Hungary.
@conferencepaper{conferencepaper, author={İzel Çağın Odabaşı Et Al. }, title={A Rare Event Based Yield Estimation Methodology for Analog Circuits}, congress name={2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits Systems (DDECS)}, city={Budapest}, country={Hungary}, year={2018}}