Review: Analog design methodologies for reliability in nanoscale CMOS circuits

AFACAN E., YELTEN M. B., DÜNDAR G.

2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), Giardini Naxos, Italy, 12 - 15 Haziran 2017 identifier

  • Yayın Türü: Bildiri / Tam Metin Bildiri
  • Doi Numarası: 10.1109/smacd.2017.7981608
  • Basıldığı Şehir: Giardini Naxos, Italy
  • Kocaeli Üniversitesi Adresli: Evet