Un-doped and Ti-doped (5, 10 and 15 mol%) antiferroelectric and ferroelectric lead zirconate-PbZrO3 (PZ) thin films were prepared by sol-gel spin coating method. All PZ films crystallized in the perovskite phase with full  pseudocubic orientation with a uniform microstructure. The paraelectric-ferroelectric phase transition temperature was found to shift to lower values and the electrical properties were found to degrade as a result of decreasing film thickness. The leakage current of the un-doped PZ films were dominated by the space-charge-fimited current, whereas Poole-Frenkel conduction mechanism was found to be dominant at the Ti-doped films at high electric fields. (c) 2007 Elsevier B.V. All rights reserved.