Ag-metallization effects on optical and electrical properties of porous silicon


KAYAHAN E. , Ceylan N., Esmer K.

APPLIED SURFACE SCIENCE, vol.255, no.5, pp.2808-2812, 2008 (Journal Indexed in SCI) identifier identifier

  • Publication Type: Article / Article
  • Volume: 255 Issue: 5
  • Publication Date: 2008
  • Doi Number: 10.1016/j.apsusc.2008.08.012
  • Title of Journal : APPLIED SURFACE SCIENCE
  • Page Numbers: pp.2808-2812

Abstract

In this study, the chemisorption of Ag atoms to the porous silicon (PS) surface was studied with premetallization and post-metallization processes. The photoluminescence (PL), Fourier transform infrared (FTIR) spectroscopy and electrical properties of the Ag/PS samples via different metallization processes were examined. The PL spectra show a shift towards the high energy region in both of the metallized samples. According to the FTIR results, the Ag atoms coordinate themselves with respect to Si atoms on the surface through the oxygen and hydrogen atoms.