Measurement of embedded As-74 decay branching ratio at low temperatures

FARKAS, J.; GYURKY, GY; Yalcin, CANER; ELEKES, Z.; KISS, G.; FULOP, ZS; SOMORJAI, E.; VAD, K.; HAKL, J.; MESZAROS, S.

doi:10.1088/0954-3899/36/10/105101

Measurement of embedded As-74 decay branching ratio at low temperatures

FARKAS J., GYURKY G., Yalcin C., ELEKES Z., KISS G. G., FULOP Z., ...Daha Fazla

JOURNAL OF PHYSICS G-NUCLEAR AND PARTICLE PHYSICS, cilt.36, sa.10, 2009 (SCI-Expanded, Scopus)

Yayın Türü: Makale / Tam Makale
Cilt numarası: 36 Sayı: 10
Basım Tarihi: 2009
Doi Numarası: 10.1088/0954-3899/36/10/105101
Dergi Adı: JOURNAL OF PHYSICS G-NUCLEAR AND PARTICLE PHYSICS
Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
Kocaeli Üniversitesi Adresli: Evet

Özet

The branching ratio between the beta(-) and beta(+)/epsilon decays of As-74 has been measured in Ge and Ta environments at temperatures ranging from 250 mK to 300 K. No significant dependence on the temperature has been found. Our work confirms the results of the low-temperature measurement of Kumar et al (2008 Phys. Rev. C 77 051304), but with increased precision due to the special choice of the radioactive source.