Measurement of embedded As-74 decay branching ratio at low temperatures


FARKAS J., GYURKY G., Yalcin C. , ELEKES Z., KISS G. G. , FULOP Z., et al.

JOURNAL OF PHYSICS G-NUCLEAR AND PARTICLE PHYSICS, cilt.36, 2009 (SCI İndekslerine Giren Dergi)

  • Cilt numarası: 36 Konu: 10
  • Basım Tarihi: 2009
  • Doi Numarası: 10.1088/0954-3899/36/10/105101
  • Dergi Adı: JOURNAL OF PHYSICS G-NUCLEAR AND PARTICLE PHYSICS

Özet

The branching ratio between the beta(-) and beta(+)/epsilon decays of As-74 has been measured in Ge and Ta environments at temperatures ranging from 250 mK to 300 K. No significant dependence on the temperature has been found. Our work confirms the results of the low-temperature measurement of Kumar et al (2008 Phys. Rev. C 77 051304), but with increased precision due to the special choice of the radioactive source.