Modelling of Hardness and Electrical Conductivity of Cu-4Ti (wt.%) Alloy and Estimation of Aging Parameters Using Metaheuristic Algorithms


Konieczny J., Labisz K., Ürgün S., Yiğit H., Fidan S., Bora M. Ö., ...Daha Fazla

MATERIALS, cilt.18, sa.10, 2025 (SCI-Expanded) identifier identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 18 Sayı: 10
  • Basım Tarihi: 2025
  • Doi Numarası: 10.3390/ma18102366
  • Dergi Adı: MATERIALS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, Aerospace Database, CAB Abstracts, Communication Abstracts, Compendex, INSPEC, Metadex, Veterinary Science Database, Directory of Open Access Journals, Civil Engineering Abstracts
  • Kocaeli Üniversitesi Adresli: Evet

Özet

This study focuses on cold deformation and age effects on the microhardness and electric conductivity of the Cu-4Ti (wt.%) alloys. The samples were solution treated at 900 degrees C, quenched in water, and aged at 450-600 degrees C for 1-120 min. Fifty percent cold rolling was performed before aging to analyze the impact on their microstructure and properties. Hardness and electric conductivity were examined by the Vickers microhardness and F & ouml;rster testing. Hardness increased significantly while electric conductivity was maintained. The optimal hardness of 298 HV appeared following 50% cold rolling and aging for 120 min at 450 degrees C, and an electric conductivity of 9.4 MS/m was achieved after 120 min at 600 degrees C in cold-rolled materials. The deformed and solution-treated materials reached 244 HV after 120 min at 500 degrees C, and electric conductivity reached 7.7 MS/m. Polynomial models of regression were used to analyze the impact of aging parameters on properties. Process parameters were properly optimized by applying metaheuristic algorithms. These contributions ensure a better understanding of the relationship between the microstructure and properties in Cu-Ti alloys, as well as their application in aircraft and electronics.