Morphological investigation of polymer solar cell layers using atomic force microscopy and Raman spectroscopy

Creative Commons License

Candan İ.

International Conference on Advanced Materials Science & Engineering and High Tech Devices Applications; Exhibition (ICMATSE 2020), Ankara, Türkiye, 2 - 04 Ekim 2020, ss.184-185

  • Yayın Türü: Bildiri / Özet Bildiri
  • Basıldığı Şehir: Ankara
  • Basıldığı Ülke: Türkiye
  • Sayfa Sayıları: ss.184-185
  • Kocaeli Üniversitesi Adresli: Evet

Özet

In the present work,  the photoactive layer of blended of poly (3- hexylthiophene) (P3HT) and [6,6]-phenyl C61-butyric acid methylester (PCBM) based on BHJ concept was used to produce PCS. The configuration of Ag/MoO3/ P3HT:PCBM/ZnO/ITO/Glass was used. Confocal Raman measurements and Atomic Force Microscope (AFM) were carried out at room temperature to figure out the morphology of PSC layers. Raman spectra shown that the strongest peak for ZnO thin film was at 437 cm−1 and the most intensive Raman peak of P3HT:PCBM photoactive layer was observed at 1442 cm-1. Moreover, other Raman peaks for both ZnO and P3HT were clearly observed in the Raman spectroscopy results. The photovoltaic (PV) performance of PCS was evaluated by using the current density-voltage (J-V) measurement under AM 1.5 illumination. The power conversion efficiencies (PCE) of PSC was measured as 3.74 %.  Additionally, the device exhibited a short-circuit current (JSC)) of 9.95 mA/cm2, open-circuit voltage (VOC) of 0.57 V and fill factor (FF) of  66%.