Chemical solution deposited silver tantalate niobate, Ag-x(Ta0.5Nb0.5)O3-y, thin films on (111)Pt/Ti/SiO2/(100)Si substrates

Telli M. B., Trolier-McKinstry S., Woodward D. I., Reaney I. M.

JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY, vol.42, no.3, pp.407-414, 2007 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 42 Issue: 3
  • Publication Date: 2007
  • Doi Number: 10.1007/s10971-006-0204-8
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.407-414
  • Keywords: silver tantalate niobate, thin film, chemical solution deposition, GEL, TRANSITION, CERAMICS
  • Kocaeli University Affiliated: No


Silver tantalate niobate films are candidates for temperature stable microwave dielectrics. In this work, a chemical solution deposition synthesis method was developed for Ag (x)(Ta0.5Nb0.5)O3-y films on Pt-coated Si substrates. Stable solutions with a range of silver stoichiometries were prepared using 2-methoxyethanol and pyridine as solvents, from AgNO3 and Nb and Ta ethoxide precursors. It was extremely difficult to prepare phase-pure perovskite films of Ag(Ta0.5Nb0.5)O-3 on Pt-coated Si subtrates; instead a mixture of perovskite and natrotantite phases was identified. Such mixed phase films had dielectric constant epsilon(r) and dielectric loss tan delta values ranging from 200 +/- 20 to 270 +/- 25 and 0.006 +/- 0.002 to 0.002 +/- 0.001 at 100 kHz, respectively, depending on the firing temperature. For Ag-2(Ta0.5Nb0.5)(4)O-11, Ag-0.8(Ta0.5Nb0.5)O-2.9, Ag-0.85(Ta0.5Nb0.5)O-2.925 and Ag-0.9(Ta0.5Nb0.5)O-2.95 films, mainly the natrotantite phase was observed. The epsilon (r) values of these films were between 70 +/- 10 and 130 +/- 15 with tan delta values of 0.008 +/- 0.002 at 100 kHz.