Reliability assessment of CMOS differential cross-coupled LC oscillators and a novel on chip self-healing approach against aging phenomena

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Afacan E., Dundar G., Baskaya F.

Microelectronics Reliability, vol.54, no.2, pp.397-403, 2014 (SCI-Expanded)

• Publication Type: Article / Abstract
• Volume: 54 Issue: 2
• Publication Date: 2014
• Doi Number: 10.1016/j.microrel.2013.08.013
• Journal Name: Microelectronics Reliability
• Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
• Page Numbers: pp.397-403
• Kocaeli University Affiliated: No