Reliability assessment of CMOS differential cross-coupled LC oscillators and a novel on chip self-healing approach against aging phenomena

Afacan E. , Dundar G., Baskaya F.

Microelectronics Reliability, vol.54, pp.397-403, 2014 (Journal Indexed in SCI) identifier identifier

  • Publication Type: Article / Abstract
  • Volume: 54 Issue: 2
  • Publication Date: 2014
  • Doi Number: 10.1016/j.microrel.2013.08.013
  • Title of Journal : Microelectronics Reliability
  • Page Numbers: pp.397-403