Reliability assessment of CMOS differential cross-coupled LC oscillators and a novel on chip self-healing approach against aging phenomena

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Afacan E. , Dundar G., Baskaya F.

Microelectronics Reliability, vol.54, pp.397-403, 2014 (Journal Indexed in SCI)

• Publication Type: Article / Abstract
• Volume: 54 Issue: 2
• Publication Date: 2014
• Doi Number: 10.1016/j.microrel.2013.08.013
• Title of Journal : Microelectronics Reliability
• Page Numbers: pp.397-403