Reliability assessment of CMOS differential cross-coupled LC oscillators and a novel on chip self-healing approach against aging phenomena

Afacan E., Dundar G., Baskaya F.

Microelectronics Reliability, vol.54, no.2, pp.397-403, 2014 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Abstract
  • Volume: 54 Issue: 2
  • Publication Date: 2014
  • Doi Number: 10.1016/j.microrel.2013.08.013
  • Journal Name: Microelectronics Reliability
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.397-403
  • Kocaeli University Affiliated: No