A Rare Event Based Yield Estimation Methodology for Analog Circuits

Odabaşı İ. Ç., YELTEN M. B., AFACAN E., BAŞKAYA İ. F., PUSANE A. E., DÜNDAR G.

2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits Systems (DDECS), Budapest, Hungary, 25 - 27 April 2018, (Full Text) identifier

  • Publication Type: Conference Paper / Full Text
  • Doi Number: 10.1109/ddecs.2018.00013
  • City: Budapest
  • Country: Hungary
  • Kocaeli University Affiliated: Yes