A Rare Event Based Yield Estimation Methodology for Analog Circuits


Odabaşı İ. Ç. , YELTEN M. B. , AFACAN E. , BAŞKAYA İ. F. , PUSANE A. E. , DÜNDAR G.

2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits Systems (DDECS), Budapest, Hungary, 25 - 27 April 2018 identifier